E1: Systems, Interference Analysis, and Sensors
Fri, 9 Jan, 13:20 - 17:00 MT (UTC -7)
Location: Flatirons 2
Session Type: Lecture
Track: Commission E: Electromagnetic Environment and Interference
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Fri, 9 Jan, 13:20 - 13:40 MT (UTC -7)

E1.1: Interference Monitoring with NRDZ-as-a-Service at Hat Creek Radio Observatory

Curtis Watson, William Young, Patricia Larkoski, The MITRE Corporation, United States
Fri, 9 Jan, 13:40 - 14:00 MT (UTC -7)

E1.2: Wi-Fi Interference on a Satellite System in GEO

Mustafa Yilmaz, National Telecommunications and Information Administration, United States
Fri, 9 Jan, 14:00 - 14:20 MT (UTC -7)

E1.3: L-Band Mobile-Satellite Uplink Interference to GPS: Measurements and Simulations

Yankai Peng, J. Nicholas Laneman, University of Notre Dame, United States
Fri, 9 Jan, 14:20 - 14:40 MT (UTC -7)

E1.4: A Simple Formula for the Mean Peak-to-Average Power Ratio of Sampled Complex-Valued White Gaussian Noise and Its Application to Radio Spectrum Measurements

Adam Wunderlich, Aric Sanders, National Institute of Standards and Technology, United States
Break
Fri, 9 Jan, 15:20 - 15:40 MT (UTC -7)

E1.6: A Comparison of Fast Techniques to Monte Carlo Techniques for Aggregate Modelling Including Clutter

Joel Dumke, Institute for Telecommunication Sciences, United States
Fri, 9 Jan, 15:40 - 16:00 MT (UTC -7)

E1.7: Modeling and Measurement of NASCTN SEA Sensors in CBRS Ecosystem

Thao Nguyen, Duncan McGillivray, Aric Sanders, National Institute of Standards and Technology, United States; Todd Schumann, National Telecommunications and Information Administration, United States
Fri, 9 Jan, 16:00 - 16:20 MT (UTC -7)

E1.8: Preliminary Selection Criteria and Considerations for Receiver Site Installation at McMurdo, Station Antarctica

Adam Hicks, Robert Achatz, ITS, United States
Fri, 9 Jan, 16:20 - 16:40 MT (UTC -7)

E1.9: Long-Term Calibration Trends and Observations from Deployed NASCTN SEA Sensors

Todd Schumann, National Telecommunications and Information Administration, United States; Aric Sanders, Duncan McGillivray, National Institute of Standards and Technology, United States